Microanalysis of light emitting silicon nanostructures

S. Karirinne; J. Keränen; T. Lepistö; L. Heikkilä; T. Kuusela; R. Punkkinen

Microanalysis of light emitting silicon nanostructures

S. Karirinne, J. Keränen, T. Lepistö, L. Heikkilä, T. Kuusela, R. Punkkinen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

Translated title of the contribution	Microanalysis of light emitting silicon nanostructures
Original language	English
Title of host publication	SCANDEM, Final Programme and Proceedings, 52nd annual meeting of the Scandinavian Society for Electron Microscopy, SCANDEM 2001, June 12-15 , Huddige, Stockholm, Sweden
Pages	178-179
Publication status	Published - 2001
Publication type	B3 Article in conference proceedings

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Cite this

@inproceedings{e68dbbbd360e43249d05f687ebedd273,

title = "Microanalysis of light emitting silicon nanostructures",

author = "S. Karirinne and J. Ker{\"a}nen and T. Lepist{\"o} and L. Heikkil{\"a} and T. Kuusela and R. Punkkinen",

note = "Contribution: organisation=mol elm,FACT1=1",

year = "2001",

language = "English",

pages = "178--179",

booktitle = "SCANDEM, Final Programme and Proceedings, 52nd annual meeting of the Scandinavian Society for Electron Microscopy, SCANDEM 2001, June 12-15 , Huddige, Stockholm, Sweden",

}

Microanalysis of light emitting silicon nanostructures. / Karirinne, S.; Keränen, J.; Lepistö, T. et al.

SCANDEM, Final Programme and Proceedings, 52nd annual meeting of the Scandinavian Society for Electron Microscopy, SCANDEM 2001, June 12-15 , Huddige, Stockholm, Sweden. 2001. p. 178-179.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

TY - GEN

T1 - Microanalysis of light emitting silicon nanostructures

AU - Karirinne, S.

AU - Keränen, J.

AU - Lepistö, T.

AU - Heikkilä, L.

AU - Kuusela, T.

AU - Punkkinen, R.

N1 - Contribution: organisation=mol elm,FACT1=1

PY - 2001

Y1 - 2001

M3 - Conference contribution

SP - 178

EP - 179

BT - SCANDEM, Final Programme and Proceedings, 52nd annual meeting of the Scandinavian Society for Electron Microscopy, SCANDEM 2001, June 12-15 , Huddige, Stockholm, Sweden

ER -