New Polarization Techniques for Precise Characterization of Second-order Thin Films

S. Cattaneo, M. Siltanen, M. Kauranen

Research output: Contribution to journal › Article › Scientific › peer-review

6 Citations (Scopus)

Translated title of the contribution	New Polarization Techniques for Precise Characterization of Second-order Thin Films
Original language	English
Pages (from-to)	513-523
Journal	Journal of Nonlinear Optical Physics and Materials
Volume	12
Issue number	4
Publication status	Published - 2003
Publication type	A1 Journal article-refereed

Publication forum classification

@article{28889691202446a88de035ca990fb974,

title = "New Polarization Techniques for Precise Characterization of Second-order Thin Films",

author = "S. Cattaneo and M. Siltanen and M. Kauranen",

note = "Contribution: organisation=fys,FACT1=1",

year = "2003",

language = "English",

volume = "12",

pages = "513--523",

journal = "Journal of Nonlinear Optical Physics and Materials",

issn = "0218-8635",

publisher = "World Scientific Publishing",

number = "4",

}

TY - JOUR

T1 - New Polarization Techniques for Precise Characterization of Second-order Thin Films

AU - Cattaneo, S.

AU - Siltanen, M.

AU - Kauranen, M.

N1 - Contribution: organisation=fys,FACT1=1

PY - 2003

Y1 - 2003

M3 - Article

SN - 0218-8635

VL - 12

SP - 513

EP - 523

JO - Journal of Nonlinear Optical Physics and Materials

JF - Journal of Nonlinear Optical Physics and Materials

IS - 4

ER -