Abstract
Here, we demonstrate the arbitrary control of longitudinal fields and its spatial distribution at the focus of a microscope objective using nonlinear microscopy with engineered phase jumps (or discontinuities) in the excitation beam profile.
Original language | English |
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Number of pages | 1 |
Publication status | Published - 2016 |
Event | OPTICS DAYS - Duration: 1 Jan 1900 → … |
Conference
Conference | OPTICS DAYS |
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Period | 1/01/00 → … |