Nonlinear microscopy of nano-objects using spatially engineered phase jumps

Leo Turquet, Joona-Pekko Kakko, L. Karvonen, H. Jiang, Tero Jesse Isotalo, Teppo Huhtio, Kari Tapio Niemi, E. Kauppinen, Harri Lipsanen, Martti Olavi Kauranen, Godofredo Jr Bautista

    Research output: Other conference contributionAbstractScientific

    Abstract

    Here, we demonstrate the arbitrary control of longitudinal fields and its spatial distribution at the focus of a microscope objective using nonlinear microscopy with engineered phase jumps (or discontinuities) in the excitation beam profile.
    Original languageEnglish
    Number of pages1
    Publication statusPublished - 2016
    EventOPTICS DAYS -
    Duration: 1 Jan 1900 → …

    Conference

    ConferenceOPTICS DAYS
    Period1/01/00 → …

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