On properties of visual quality metrics in remote sensing applications

Oleg Ieremeiev, Vladimir Lukin, Krzysztof Okarma, Karen Egiazarian, Benoit Vozel

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

5 Citations (Scopus)

Abstract

Visual quality is important for remote sensing data presented as grayscale, color or pseudo-color images. Although several visual quality metrics (VQMs) have been used to characterize such data, only a limited analysis of their applicability in remote sensing applications has been done so far. In this paper, we study correlation factors for a wide set of VQMs for color images with distortion types typical for remote sensing. It is demonstrated that there are many metrics that have very high Spearman rank order correlation, e.g. PSNR-based and SSIM-based metrics. Meanwhile, there are also metrics that are practically uncorrelated with others. A detailed analysis of VQMs that have the largest SROCC values and belong to different groups is presented in this paper.

Original languageEnglish
Title of host publicationProc. IS&T Int’l. Symp. on Electronic Imaging: Image Processing: Algorithms and Systems, 2022
Volume34
Edition10
DOIs
Publication statusPublished - 2022
Publication typeA4 Article in conference proceedings
EventIS and T International Symposium on Electronic Imaging: Image Processing: Algorithms and Systems -
Duration: 17 Jan 202226 Jan 2022

Publication series

NameIS and T International Symposium on Electronic Imaging Science and Technology
ISSN (Print)2470-1173

Conference

ConferenceIS and T International Symposium on Electronic Imaging: Image Processing: Algorithms and Systems
Period17/01/2226/01/22

Keywords

  • correlation analysis
  • neural network
  • remote sensing image
  • visual quality

Publication forum classification

  • Publication forum level 1

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Human-Computer Interaction
  • Software
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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