TY - GEN
T1 - On properties of visual quality metrics in remote sensing applications
AU - Ieremeiev, Oleg
AU - Lukin, Vladimir
AU - Okarma, Krzysztof
AU - Egiazarian, Karen
AU - Vozel, Benoit
N1 - Publisher Copyright:
© 2022, Society for Imaging Science and Technology.
jufoid=84313
PY - 2022
Y1 - 2022
N2 - Visual quality is important for remote sensing data presented as grayscale, color or pseudo-color images. Although several visual quality metrics (VQMs) have been used to characterize such data, only a limited analysis of their applicability in remote sensing applications has been done so far. In this paper, we study correlation factors for a wide set of VQMs for color images with distortion types typical for remote sensing. It is demonstrated that there are many metrics that have very high Spearman rank order correlation, e.g. PSNR-based and SSIM-based metrics. Meanwhile, there are also metrics that are practically uncorrelated with others. A detailed analysis of VQMs that have the largest SROCC values and belong to different groups is presented in this paper.
AB - Visual quality is important for remote sensing data presented as grayscale, color or pseudo-color images. Although several visual quality metrics (VQMs) have been used to characterize such data, only a limited analysis of their applicability in remote sensing applications has been done so far. In this paper, we study correlation factors for a wide set of VQMs for color images with distortion types typical for remote sensing. It is demonstrated that there are many metrics that have very high Spearman rank order correlation, e.g. PSNR-based and SSIM-based metrics. Meanwhile, there are also metrics that are practically uncorrelated with others. A detailed analysis of VQMs that have the largest SROCC values and belong to different groups is presented in this paper.
KW - correlation analysis
KW - neural network
KW - remote sensing image
KW - visual quality
U2 - 10.2352/EI.2022.34.10.IPAS-354
DO - 10.2352/EI.2022.34.10.IPAS-354
M3 - Conference contribution
AN - SCOPUS:85132408368
VL - 34
T3 - IS and T International Symposium on Electronic Imaging Science and Technology
BT - Proc. IS&T Int’l. Symp. on Electronic Imaging: Image Processing: Algorithms and Systems, 2022
T2 - IS and T International Symposium on Electronic Imaging: Image Processing: Algorithms and Systems
Y2 - 17 January 2022 through 26 January 2022
ER -