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On reachable state space reduction for formal validation of scan-based systems

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    2 Citations (Scopus)
    Translated title of the contributionOn reachable state space reduction for formal validation of scan-based systems
    Original languageEnglish
    Title of host publicationINDIN'06, 2006 IEEE International Conference on Industrial Informatics. Integrating Manufacturing and Services Systems. 16-18 August, 2006. Grand Copthorne Waterfront Hotel, Singapore
    Pages79-84
    Publication statusPublished - 2006
    Publication typeA4 Article in conference proceedings

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