On The Benefits of the Accelerate Metrics: An Industrial Survey at Vendasta

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

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Original language	English
Title of host publication	IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER2022)
Publisher	IEEE
Number of pages	5
ISBN (Electronic)	978-1-6654-3786-8
Publication status	Published - Mar 2022
Publication type	A4 Article in conference proceedings
Event	IEEE International Conference on Software Analysis, Evolution and Reengineering - Honolulu, United States Duration: 15 Mar 2022 → 18 Mar 2022

Conference	IEEE International Conference on Software Analysis, Evolution and Reengineering
Country/Territory	United States
City	Honolulu
Period	15/03/22 → 18/03/22

Publication forum classification

2022_SANER_VendastaStudy_5
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Accepted author manuscript, 132 KB

@inproceedings{ec5d116811ad480aba6c207e80d8ea68,

title = "On The Benefits of the Accelerate Metrics: An Industrial Survey at Vendasta",

author = "Francesco Lomio and Zadia Codabux and Dale Birch and Dale Hopkins and Davide Taibi",

year = "2022",

month = mar,

language = "English",

booktitle = "IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER2022)",

publisher = "IEEE",

address = "United States",

note = " IEEE International Conference on Software Analysis, Evolution and Reengineering ; Conference date: 15-03-2022 Through 18-03-2022",

}

Lomio, F, Codabux, Z, Birch, D, Hopkins, D & Taibi, D 2022, On The Benefits of the Accelerate Metrics: An Industrial Survey at Vendasta. in IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER2022). IEEE, IEEE International Conference on Software Analysis, Evolution and Reengineering, Honolulu, United States, 15/03/22. <https://urn.fi/URN:NBN:fi:tuni-202208176460>

TY - GEN

T1 - On The Benefits of the Accelerate Metrics: An Industrial Survey at Vendasta

AU - Lomio, Francesco

AU - Codabux, Zadia

AU - Birch, Dale

AU - Hopkins, Dale

AU - Taibi, Davide

PY - 2022/3

Y1 - 2022/3

M3 - Conference contribution

BT - IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER2022)

PB - IEEE

T2 - IEEE International Conference on Software Analysis, Evolution and Reengineering

Y2 - 15 March 2022 through 18 March 2022

ER -