Post Stress RF-Drifts of Dual Band LC-VCO in 0.18 μm CMOS Technology

Sanjeev Jain, Sheng-Lyang Jang, Miin-Horng Juang

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	243-248
Number of pages	6
Journal	International Journal of RF and Microwave Computer-Aided Engineering
Volume	24
Issue number	2
DOIs	https://doi.org/10.1002/mmce.20755
Publication status	Published - 1 Mar 2014
Externally published	Yes
Publication type	A1 Journal article-refereed

Publication forum classification

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title = "Post Stress RF-Drifts of Dual Band LC-VCO in 0.18 μm CMOS Technology",

author = "Sanjeev Jain and Sheng-Lyang Jang and Miin-Horng Juang",

year = "2014",

month = mar,

day = "1",

doi = "10.1002/mmce.20755",

language = "English",

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journal = "International Journal of RF and Microwave Computer-Aided Engineering",

issn = "1096-4290",

publisher = "John Wiley and Sons Inc.",

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}

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T1 - Post Stress RF-Drifts of Dual Band LC-VCO in 0.18 μm CMOS Technology

AU - Jain, Sanjeev

AU - Jang, Sheng-Lyang

AU - Juang, Miin-Horng

PY - 2014/3/1

Y1 - 2014/3/1

U2 - 10.1002/mmce.20755

DO - 10.1002/mmce.20755

M3 - Article

SN - 1096-4290

VL - 24

SP - 243

EP - 248

JO - International Journal of RF and Microwave Computer-Aided Engineering

JF - International Journal of RF and Microwave Computer-Aided Engineering

IS - 2

ER -