Reliability analysis of two frequency converter generations using system-level stress testing

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Translated title of the contribution	Reliability analysis of two frequency converter generations using system-level stress testing
Original language	English
Pages (from-to)	929-1244
Journal	IET Power Electronics
Volume	5
Issue number	7
DOIs	https://doi.org/10.1049/iet-pel.2011.0381
Publication status	Published - 2012
Publication type	A1 Journal article-refereed

Publication forum classification

@article{1ecf95d7b3414ae2a0a360897e811400,

title = "Reliability analysis of two frequency converter generations using system-level stress testing",

author = "Janne Kiilunen and Laura Frisk",

note = "Contribution: organisation=ele,FACT1=1<br/>Publisher name: Institution of Engineering and Technology IET",

year = "2012",

doi = "10.1049/iet-pel.2011.0381",

language = "English",

volume = "5",

pages = "929--1244",

journal = "IET Power Electronics",

issn = "1755-4535",

publisher = "John Wiley \& Sons",

number = "7",

}

TY - JOUR

T1 - Reliability analysis of two frequency converter generations using system-level stress testing

AU - Kiilunen, Janne

AU - Frisk, Laura

N1 - Contribution: organisation=ele,FACT1=1<br/>Publisher name: Institution of Engineering and Technology IET

PY - 2012

Y1 - 2012

U2 - 10.1049/iet-pel.2011.0381

DO - 10.1049/iet-pel.2011.0381

M3 - Article

SN - 1755-4535

VL - 5

SP - 929

EP - 1244

JO - IET Power Electronics

JF - IET Power Electronics

IS - 7

ER -