Translated title of the contribution | Reliability of n-bit nanotechnology adder |
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Original language | English |
Title of host publication | Proceedings of IEEE Computer Society Annual Symposium on VLSI, 7-9 April 2008, Montpellier, France |
Editors | L. Torres |
Pages | 34-39 |
DOIs | |
Publication status | Published - 2008 |
Publication type | A4 Article in conference proceedings |
Publication forum classification
- No publication forum level