Scanner test pattern for evaluation of beam manipulation accuracy

Tero Kumpulainen, Jyrki Latokartano, Jorma Vihinen, Reijo Tuokko

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    2 Citations (Scopus)
    Translated title of the contributionScanner test pattern for evaluation of beam manipulation accuracy
    Original languageEnglish
    Title of host publicationIEEE International Symposium on Assembly and Manufacturing, ISAM 2011, 25-27 May, 2011, Tampere Hall, Tampere, Finland
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages1-6
    Number of pages6
    ISBN (Print)978-1-61284-342-1
    DOIs
    Publication statusPublished - 2011
    Publication typeA4 Article in conference proceedings

    Publication series

    NameIEEE International Symposium on Assembly and Manufacturing ISAM
    PublisherIEEE

    Publication forum classification

    • Publication forum level 1

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