Second-harmonic generation microscopy of individual metal nanoparticles using cylindrical vector beams

Godofredo Bautista, Mikko J. Huttunen, Jouni Mäkitalo, Juha M. Kontio, Janne Simonen, Martti Kauranen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

    Original languageEnglish
    Title of host publicationFocus on Microscopy 2012
    EditorsColin Sheppard, Thornsten Wohland, Fred Brakenhoff
    Place of PublicationSingapore
    Pages212
    Number of pages1
    Publication statusPublished - 2012
    Publication typeB3 Non-refereed article in conference proceedings

    Publication series

    NameFocus on Microscopy Series
    Number25

    Publication forum classification

    • No publication forum level

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