Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams

Godofredo Jr Bautista; Jouni Aleksi Mäkitalo; Ya Chen; Veer Dhaka; Marco Grasso; Lasse Karvonen; Hua Jiang; Mikko Johannes Huttunen; Teppo Huhtio; Harri Lipsanen; Martti Olavi Kauranen

Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams

Godofredo Jr Bautista, Jouni Aleksi Mäkitalo, Ya Chen, Veer Dhaka, Marco Grasso, Lasse Karvonen, Hua Jiang, Mikko Johannes Huttunen, Teppo Huhtio, Harri Lipsanen, Martti Olavi Kauranen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

Original language	English
Title of host publication	Focus on Microscopy 2015
Editors	Gertrude Bunt, Fred Wouters, Fred Brakenhoff
Pages	91
Number of pages	1
Publication status	Published - 2015
Publication type	B3 Article in conference proceedings

Publication series

Name	Focus on Microscopy Series
Number	28

Cite this

Bautista, G. J., Mäkitalo, J. A., Chen, Y., Dhaka, V., Grasso, M., Karvonen, L., Jiang, H., Huttunen, M. J., Huhtio, T., Lipsanen, H., & Kauranen, M. O. (2015). Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams. In G. Bunt, F. Wouters, & F. Brakenhoff (Eds.), Focus on Microscopy 2015 (pp. 91). Article MO-AF2-PAR-E (Focus on Microscopy Series; No. 28).

@inproceedings{c2809f979a444acbb6a76a86ea403463,

title = "Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams",

author = "Bautista, {Godofredo Jr} and M{\"a}kitalo, {Jouni Aleksi} and Ya Chen and Veer Dhaka and Marco Grasso and Lasse Karvonen and Hua Jiang and Huttunen, {Mikko Johannes} and Teppo Huhtio and Harri Lipsanen and Kauranen, {Martti Olavi}",

note = "xabstract",

year = "2015",

language = "English",

series = "Focus on Microscopy Series",

number = "28",

pages = "91",

editor = "Gertrude Bunt and Fred Wouters and Fred Brakenhoff",

booktitle = "Focus on Microscopy 2015",

}

Bautista, GJ, Mäkitalo, JA, Chen, Y, Dhaka, V, Grasso, M, Karvonen, L, Jiang, H, Huttunen, MJ, Huhtio, T, Lipsanen, H & Kauranen, MO 2015, Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams. in G Bunt, F Wouters & F Brakenhoff (eds), Focus on Microscopy 2015., MO-AF2-PAR-E, Focus on Microscopy Series, no. 28, pp. 91.

Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams. / Bautista, Godofredo Jr; Mäkitalo, Jouni Aleksi; Chen, Ya et al.
Focus on Microscopy 2015. ed. / Gertrude Bunt; Fred Wouters; Fred Brakenhoff. 2015. p. 91 MO-AF2-PAR-E (Focus on Microscopy Series; No. 28).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

TY - GEN

T1 - Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams

AU - Bautista, Godofredo Jr

AU - Mäkitalo, Jouni Aleksi

AU - Chen, Ya

AU - Dhaka, Veer

AU - Grasso, Marco

AU - Karvonen, Lasse

AU - Jiang, Hua

AU - Huttunen, Mikko Johannes

AU - Huhtio, Teppo

AU - Lipsanen, Harri

AU - Kauranen, Martti Olavi

N1 - xabstract

PY - 2015

Y1 - 2015

UR - http://www.focusonmicroscopy.org/2015/PDF/205_Bautista.pdf

M3 - Conference contribution

T3 - Focus on Microscopy Series

SP - 91

BT - Focus on Microscopy 2015

A2 - Bunt, Gertrude

A2 - Wouters, Fred

A2 - Brakenhoff, Fred

ER -

Second-harmonic generation microscopy of vertically aligned semiconductor nanowires using vector beams

Publication series

Other files and links

Cite this