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Sequential Detection Applied to Line-Scan Gray Level Defect Imaging
Juho Vihonen
Research output
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Book/Report
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Doctoral thesis
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Collection of Articles
550
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Dive into the research topics of 'Sequential Detection Applied to Line-Scan Gray Level Defect Imaging'. Together they form a unique fingerprint.
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Keyphrases
Gray Level
100%
Web Inspection System
100%
Dynamic Programming
100%
Defect Imaging
100%
Line Scan
100%
Sequential Detection
100%
Signal Processing
50%
Sampling Methods
50%
Computationally Expensive
50%
Electro-optic
50%
Industrial Application
50%
Real-time Detection
50%
Production Quality
50%
Image Processing
50%
Low Contrast
50%
Processing Time
50%
Small Changes
50%
Small-sized
50%
Paper Web
50%
Surface Defects
50%
High Contrast
50%
False Alarm
50%
Parallel Processing
50%
Best Solution
50%
Inspection System
50%
Random Variables
50%
Real-time Requirements
50%
Performance Effectiveness
50%
Sensing Area
50%
Cumulative Sum
50%
Large Defects
50%
Technological Process
50%
Unknown Dynamics
50%
Quickest Detection
50%
Sequential Algorithm
50%
Abnormal Change
50%
Defect Detection
50%
Paper Production
50%
Sequential Dynamics
50%
Defect Classification
50%
Proof of Optimality
50%
Contrast Dynamics
50%
Sequential Problem
50%
Fixed Sample Size
50%
Optical Quality Control
50%
Real-time Classification
50%
Engineering
Dynamic Programming
100%
Grey Level
100%
Sequential Detection
100%
Optimality
50%
Production Line
50%
Industrial Applications
50%
Image Processing
50%
Processing Time
50%
Random Variable ξ
50%
False Alarm
50%
Quality Control
50%
Paper Web
50%
Optical Quality
50%
Technological Process
50%
Simplest Case
50%
Computer Science
Inspection System
100%
Dynamic Programming
66%
Production Line
33%
Image Processing
33%
Processing Time
33%
Presented Approach
33%
Time Requirement
33%
Parallel Processing
33%
Random Variable
33%
Optical Quality
33%
Sequential Algorithm
33%
Industrial Applications
33%
Material Science
Surface Flaw
100%