Sharpness metric for no-reference image visual quality assessment

Nikolay Ponomarenko; Vladimir Lukin; Oleg Eremeev; Karen Egiazarian; Jaakko Astola

doi:10.1117/12.906393

Sharpness metric for no-reference image visual quality assessment

Nikolay Ponomarenko
, Vladimir Lukin
, Oleg Eremeev
, Karen Egiazarian
, Jaakko Astola

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

13 Citations (Scopus)

Translated title of the contribution	Sharpness metric for no-reference image visual quality assessment
Original language	English
Title of host publication	Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 23-25 January 2012, Burlingame, CA, USA. Proceedings of SPIE
Editors	Karen Egiazarian, Sos S. Agaian, Atanas P. Gotchev, John Recker, Guijin Wang
Place of Publication	Bellingham, WA
Publisher	SPIE
Pages	1-11
Number of pages	11
ISBN (Print)	978-0-81948-942-5
DOIs	https://doi.org/10.1117/12.906393
Publication status	Published - 2012
Publication type	A4 Article in conference proceedings
Event	SPIE CONFERENCE PROCEEDINGS - Duration: 1 Jan 1900 → …

Publication series

Name	SPIE Conference on Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications
Volume	8295
ISSN (Print)	0277-786X

Conference

Conference	SPIE CONFERENCE PROCEEDINGS
Period	1/01/00 → …

Publication forum classification

Publication forum level 1

Access to Document

10.1117/12.906393

Cite this

Ponomarenko, N., Lukin, V., Eremeev, O., Egiazarian, K., & Astola, J. (2012). Sharpness metric for no-reference image visual quality assessment. In K. Egiazarian, S. S. Agaian, A. P. Gotchev, J. Recker, & G. Wang (Eds.), Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 23-25 January 2012, Burlingame, CA, USA. Proceedings of SPIE (pp. 1-11). Article 829519 (SPIE Conference on Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications; Vol. 8295). SPIE. https://doi.org/10.1117/12.906393

Ponomarenko, Nikolay ; Lukin, Vladimir ; Eremeev, Oleg et al. / Sharpness metric for no-reference image visual quality assessment. Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 23-25 January 2012, Burlingame, CA, USA. Proceedings of SPIE. editor / Karen Egiazarian ; Sos S. Agaian ; Atanas P. Gotchev ; John Recker ; Guijin Wang. Bellingham, WA : SPIE, 2012. pp. 1-11 (SPIE Conference on Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications).

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author = "Nikolay Ponomarenko and Vladimir Lukin and Oleg Eremeev and Karen Egiazarian and Jaakko Astola",

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year = "2012",

doi = "10.1117/12.906393",

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Ponomarenko, N, Lukin, V, Eremeev, O, Egiazarian, K & Astola, J 2012, Sharpness metric for no-reference image visual quality assessment. in K Egiazarian, SS Agaian, AP Gotchev, J Recker & G Wang (eds), Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 23-25 January 2012, Burlingame, CA, USA. Proceedings of SPIE., 829519, SPIE Conference on Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications, vol. 8295, SPIE, Bellingham, WA, pp. 1-11, SPIE CONFERENCE PROCEEDINGS, 1/01/00. https://doi.org/10.1117/12.906393

Sharpness metric for no-reference image visual quality assessment. / Ponomarenko, Nikolay; Lukin, Vladimir; Eremeev, Oleg et al.
Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 23-25 January 2012, Burlingame, CA, USA. Proceedings of SPIE. ed. / Karen Egiazarian; Sos S. Agaian; Atanas P. Gotchev; John Recker; Guijin Wang. Bellingham, WA: SPIE, 2012. p. 1-11 829519 (SPIE Conference on Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications; Vol. 8295).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

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A2 - Egiazarian, Karen

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Ponomarenko N, Lukin V, Eremeev O, Egiazarian K, Astola J. Sharpness metric for no-reference image visual quality assessment. In Egiazarian K, Agaian SS, Gotchev AP, Recker J, Wang G, editors, Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II, 23-25 January 2012, Burlingame, CA, USA. Proceedings of SPIE. Bellingham, WA: SPIE. 2012. p. 1-11. 829519. (SPIE Conference on Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications). doi: 10.1117/12.906393