Translated title of the contribution | Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface |
---|---|
Original language | English |
Pages (from-to) | 8 p |
Journal | Physical Review B |
Volume | 68 |
Issue number | 19, 195410 |
DOIs | |
Publication status | Published - 2003 |
Externally published | Yes |
Publication type | A1 Journal article-refereed |
Publication forum classification
- Publication forum level 2