Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface

AS Foster, OH Pakarinen, JM Airaksinen, JD Gale, RM Nieminen

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Translated title of the contributionSimulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface
Original languageEnglish
Pages (from-to)8 p
JournalPhysical Review B
Volume68
Issue number19, 195410
DOIs
Publication statusPublished - 2003
Externally publishedYes
Publication typeA1 Journal article-refereed

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