Simulation of localization microscopy method utilizing quantum dot blinking

J. Forma, A. Engbert, P. Hänninen, Juha Toivonen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

    Translated title of the contributionSimulation of localization microscopy method utilizing quantum dot blinking
    Original languageEnglish
    Title of host publicationPALS 2009, 4th Finnish-Russian Photonics and Laser Symposium, May 24-27, 2009, Tampere
    Pages13-14
    Publication statusPublished - 2009
    Publication typeB3 Article in conference proceedings

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