Simulation of Transmission Electron Micrographs with Microscope for Windows

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Translated title of the contributionSimulation of Transmission Electron Micrographs with Microscope for Windows
    Original languageEnglish
    Title of host publicationScandem 2002, Scandinavian Society for Electron Microscopy, Proceedings Book, 12-15 June, 2002, Tampere, Finland
    EditorsJ. Keränen, K. Sillanpää
    Pages130-131
    Publication statusPublished - 2002
    Publication typeA4 Article in a conference publication

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