Simulation of Transmission Electron Micrographs with Microscope for Windows

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Translated title of the contribution	Simulation of Transmission Electron Micrographs with Microscope for Windows
Original language	English
Title of host publication	Scandem 2002, Scandinavian Society for Electron Microscopy, Proceedings Book, 12-15 June, 2002, Tampere, Finland
Editors	J. Keränen, K. Sillanpää
Pages	130-131
Publication status	Published - 2002
Publication type	A4 Article in conference proceedings

Publication forum classification

@inproceedings{0c0d52b01aa54aa3a1bf7776971d67cc,

title = "Simulation of Transmission Electron Micrographs with Microscope for Windows",

author = "V.-T. Kuokkala",

note = "Contribution: organisation=mol,FACT1=1",

year = "2002",

language = "English",

pages = "130--131",

editor = "J. Ker{\"a}nen and K. Sillanp{\"a}{\"a}",

booktitle = "Scandem 2002, Scandinavian Society for Electron Microscopy, Proceedings Book, 12-15 June, 2002, Tampere, Finland",

}

Simulation of Transmission Electron Micrographs with Microscope for Windows. / Kuokkala, V.-T.
Scandem 2002, Scandinavian Society for Electron Microscopy, Proceedings Book, 12-15 June, 2002, Tampere, Finland. ed. / J. Keränen; K. Sillanpää. 2002. p. 130-131.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Simulation of Transmission Electron Micrographs with Microscope for Windows

AU - Kuokkala, V.-T.

N1 - Contribution: organisation=mol,FACT1=1

PY - 2002

Y1 - 2002

M3 - Conference contribution

SP - 130

EP - 131

BT - Scandem 2002, Scandinavian Society for Electron Microscopy, Proceedings Book, 12-15 June, 2002, Tampere, Finland

A2 - Keränen, J.

A2 - Sillanpää, K.

ER -