Surface structure and rectivity of N/Cu(100) and O+N/Cu(100) as envestigated by LEED, STM, AES and TPD

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

    Translated title of the contributionSurface structure and rectivity of N/Cu(100) and O+N/Cu(100) as envestigated by LEED, STM, AES and TPD
    Original languageEnglish
    Title of host publication17th International Vacuum Congress, July 2-6, 2007, Stockholm, Sweden
    Pages1 p
    Publication statusPublished - 2007
    Publication typeB3 Article in conference proceedings

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