Tailoring the longitudinal electric fields of high-order laser beams and their direct verification in three dimensions

Leevi Kallioniemi; Léo Turquet; Harri Lipsanen; Martti Kauranen; Godofredo Bautista

doi:10.1016/j.optcom.2019.124894

Tailoring the longitudinal electric fields of high-order laser beams and their direct verification in three dimensions

Leevi Kallioniemi, Léo Turquet, Harri Lipsanen, Martti Kauranen, Godofredo Bautista

Physics

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Abstract

We demonstrate the tailoring of longitudinal electric fields that arise from tight focusing of spatially phase-shaped high-order laser beams, and verify their spatial distribution in three dimensions. To tailor the three-dimensional (3D) spatial distribution of longitudinal electric fields, we precisely control the relative phase delay between the two lobes of a HG10 laser beam using a spatial light modulator (SLM) before tight focusing. To verify the longitudinal electric fields in the focal volume, we employ 3D microscopic mapping of second-harmonic generation (SHG) from a single semiconductor nanowire that is extremely sensitive to the orientation of the longitudinal electric field. The technique is direct, general and expected to be useful in harnessing and in probing longitudinal electric fields with arbitrary spatial intensity distributions in the 3D focal volume.

Original language	English
Article number	124894
Number of pages	6
Journal	Optics Communications
Volume	459
Early online date	6 Nov 2019
DOIs	https://doi.org/10.1016/j.optcom.2019.124894
Publication status	Published - 2020
Publication type	A1 Journal article-refereed

Keywords

Second-harmonic generation
3D microscopy
Semiconductor nanowire
Polarization
Longitudinal electric field

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title = "Tailoring the longitudinal electric fields of high-order laser beams and their direct verification in three dimensions",

abstract = "We demonstrate the tailoring of longitudinal electric fields that arise from tight focusing of spatially phase-shaped high-order laser beams, and verify their spatial distribution in three dimensions. To tailor the three-dimensional (3D) spatial distribution of longitudinal electric fields, we precisely control the relative phase delay between the two lobes of a HG10 laser beam using a spatial light modulator (SLM) before tight focusing. To verify the longitudinal electric fields in the focal volume, we employ 3D microscopic mapping of second-harmonic generation (SHG) from a single semiconductor nanowire that is extremely sensitive to the orientation of the longitudinal electric field. The technique is direct, general and expected to be useful in harnessing and in probing longitudinal electric fields with arbitrary spatial intensity distributions in the 3D focal volume.",

keywords = "Second-harmonic generation, 3D microscopy, Semiconductor nanowire, Polarization, Longitudinal electric field",

author = "Leevi Kallioniemi and L{\'e}o Turquet and Harri Lipsanen and Martti Kauranen and Godofredo Bautista",

year = "2020",

doi = "10.1016/j.optcom.2019.124894",

language = "English",

volume = "459",

journal = "Optics Communications",

issn = "0030-4018",

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T1 - Tailoring the longitudinal electric fields of high-order laser beams and their direct verification in three dimensions

AU - Kallioniemi, Leevi

AU - Turquet, Léo

AU - Lipsanen, Harri

AU - Kauranen, Martti

AU - Bautista, Godofredo

PY - 2020

Y1 - 2020

N2 - We demonstrate the tailoring of longitudinal electric fields that arise from tight focusing of spatially phase-shaped high-order laser beams, and verify their spatial distribution in three dimensions. To tailor the three-dimensional (3D) spatial distribution of longitudinal electric fields, we precisely control the relative phase delay between the two lobes of a HG10 laser beam using a spatial light modulator (SLM) before tight focusing. To verify the longitudinal electric fields in the focal volume, we employ 3D microscopic mapping of second-harmonic generation (SHG) from a single semiconductor nanowire that is extremely sensitive to the orientation of the longitudinal electric field. The technique is direct, general and expected to be useful in harnessing and in probing longitudinal electric fields with arbitrary spatial intensity distributions in the 3D focal volume.

AB - We demonstrate the tailoring of longitudinal electric fields that arise from tight focusing of spatially phase-shaped high-order laser beams, and verify their spatial distribution in three dimensions. To tailor the three-dimensional (3D) spatial distribution of longitudinal electric fields, we precisely control the relative phase delay between the two lobes of a HG10 laser beam using a spatial light modulator (SLM) before tight focusing. To verify the longitudinal electric fields in the focal volume, we employ 3D microscopic mapping of second-harmonic generation (SHG) from a single semiconductor nanowire that is extremely sensitive to the orientation of the longitudinal electric field. The technique is direct, general and expected to be useful in harnessing and in probing longitudinal electric fields with arbitrary spatial intensity distributions in the 3D focal volume.

KW - Second-harmonic generation

KW - 3D microscopy

KW - Semiconductor nanowire

KW - Polarization

KW - Longitudinal electric field

U2 - 10.1016/j.optcom.2019.124894

DO - 10.1016/j.optcom.2019.124894

M3 - Article

SN - 0030-4018

VL - 459

JO - Optics Communications

JF - Optics Communications

M1 - 124894

ER -

Tailoring the longitudinal electric fields of high-order laser beams and their direct verification in three dimensions

Abstract

Keywords

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