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Testing scheme and input sensitivity of nanomaterial risk, exposure and hazard assessment tools
Mikko Poikkimäki, Miikka Dal Maso, Niko Leskinen, Ville Koljonen, Remy Franken, Neeraj Shandilya, Joost Westerhout, Almar Snippe, Eric Schoen, Walter Brand, Joris Meesters, Joris T.K. Quik, Martine Bakker, Christiaan Delmaar, Danail Hristozov, Alex Zabeo, Panagiotis Isigonis, Henning Wigger, Bernd Nowack, Guangyu Li
Research output: Other conference contribution › Abstract › Scientific