Testing the effects of reflow on tantalum capacitors

Johanna Virkki, Timo Seppälä, Pasi Raumonen

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    4 Citations (Scopus)
    Translated title of the contributionTesting the effects of reflow on tantalum capacitors
    Original languageEnglish
    Pages (from-to)1650-1653
    JournalMicroelectronics Reliability
    Volume50
    Issue number9-11
    DOIs
    Publication statusPublished - 2010
    Publication typeA1 Journal article-refereed

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