The Effect of Parameter Uncertainty on the Reliability of Pressure Accumulator Simulations

J. Kajaste, H. Kauranne, A. Ellman, M. Pietola

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

9 Citations (Scopus)

Translated title of the contribution	The Effect of Parameter Uncertainty on the Reliability of Pressure Accumulator Simulations
Original language	English
Title of host publication	2002 ASME International Mechanical Engineering Congress and Exposition, IMECE2002, November 17-22, 2002, New Orleans, Louisiana, USA
Pages	10 s
Publication status	Published - 2002
Publication type	B3 Article in conference proceedings

Publication forum classification

@inproceedings{90a4a232ccf341bdbb2cf26834abf5b0,

title = "The Effect of Parameter Uncertainty on the Reliability of Pressure Accumulator Simulations",

author = "J. Kajaste and H. Kauranne and A. Ellman and M. Pietola",

note = "CD-ROM, ISBN 0-7918-1692-3<br/>Contribution: organisation=iha,FACT1=1",

year = "2002",

language = "English",

isbn = "0-7918-1692-3",

pages = "10 s",

booktitle = "2002 ASME International Mechanical Engineering Congress and Exposition, IMECE2002, November 17-22, 2002, New Orleans, Louisiana, USA",

}

The Effect of Parameter Uncertainty on the Reliability of Pressure Accumulator Simulations. / Kajaste, J.; Kauranne, H.; Ellman, A. et al.
2002 ASME International Mechanical Engineering Congress and Exposition, IMECE2002, November 17-22, 2002, New Orleans, Louisiana, USA. 2002. p. 10 s.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific

TY - GEN

T1 - The Effect of Parameter Uncertainty on the Reliability of Pressure Accumulator Simulations

AU - Kajaste, J.

AU - Kauranne, H.

AU - Ellman, A.

AU - Pietola, M.

N1 - CD-ROM, ISBN 0-7918-1692-3<br/>Contribution: organisation=iha,FACT1=1

PY - 2002

Y1 - 2002

M3 - Conference contribution

SN - 0-7918-1692-3

SP - 10 s

BT - 2002 ASME International Mechanical Engineering Congress and Exposition, IMECE2002, November 17-22, 2002, New Orleans, Louisiana, USA

ER -