The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

Pasi Tamminen; Leena Ukkonen; Lauri Sydänheimo

doi:10.1109/EOSESD.2015.7314766

The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

Pasi Tamminen, Leena Ukkonen, Lauri Sydänheimo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

310 Downloads (Pure)

Abstract

EC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.

Original language	English
Title of host publication	Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2015
Place of Publication	USA
Publisher	IEEE COMPUTER SOC
Number of pages	10
Volume	2015
ISBN (Print)	9781479988952
DOIs	https://doi.org/10.1109/EOSESD.2015.7314766
Publication status	Published - 27 Sept 2015
Publication type	A4 Article in conference proceedings
Event	Electrical Overstress/Electrostatic Discharge Symposium - Duration: 1 Jan 1900 → …

Conference

Conference	Electrical Overstress/Electrostatic Discharge Symposium
Period	1/01/00 → …

Keywords

USB
IEC61000-4-2
ESD
EMC
cable

Publication forum classification

Publication forum level 0

ASJC Scopus subject areas

General Engineering

Access to Document

10.1109/EOSESD.2015.7314766

7B2_Tamminen
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Accepted author manuscript, 1.68 MBLicence: Unspecified

http://urn.fi/URN:NBN:fi:tty-201603013600

Cite this

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title = "The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification",

abstract = "EC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.",

keywords = "USB, IEC61000-4-2, ESD, EMC, cable",

author = "Pasi Tamminen and Leena Ukkonen and Lauri Syd{\"a}nheimo",

year = "2015",

month = sep,

day = "27",

doi = "10.1109/EOSESD.2015.7314766",

language = "English",

isbn = "9781479988952",

volume = "2015",

booktitle = "Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2015",

publisher = "IEEE COMPUTER SOC",

note = "Electrical Overstress/Electrostatic Discharge Symposium ; Conference date: 01-01-1900",

}

Tamminen, P, Ukkonen, L & Sydänheimo, L 2015, The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification. in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2015. vol. 2015, 7B.2, IEEE COMPUTER SOC, USA, Electrical Overstress/Electrostatic Discharge Symposium, 1/01/00. https://doi.org/10.1109/EOSESD.2015.7314766

The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification. / Tamminen, Pasi; Ukkonen, Leena; Sydänheimo, Lauri.
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2015. Vol. 2015 USA: IEEE COMPUTER SOC, 2015. 7B.2.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

AU - Tamminen, Pasi

AU - Ukkonen, Leena

AU - Sydänheimo, Lauri

PY - 2015/9/27

Y1 - 2015/9/27

N2 - EC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.

AB - EC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.

KW - USB

KW - IEC61000-4-2

KW - ESD

KW - EMC

KW - cable

U2 - 10.1109/EOSESD.2015.7314766

DO - 10.1109/EOSESD.2015.7314766

M3 - Conference contribution

SN - 9781479988952

VL - 2015

BT - Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2015

PB - IEEE COMPUTER SOC

CY - USA

T2 - Electrical Overstress/Electrostatic Discharge Symposium

Y2 - 1 January 1900

ER -

The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

Abstract

Conference

Keywords

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ASJC Scopus subject areas

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