The error concealment feature in the H.26L test model

Y-K. Wang, M. M. Hannuksela, V. Varsa, A. Hourunranta, M. Gabbouj

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    281 Citations (Scopus)
    Translated title of the contributionThe error concealment feature in the H.26L test model
    Original languageEnglish
    Title of host publicationProceedings of IEEE 2002 Internantional Conference on Image Processing, ICIP, 22-25 September 2002, Rochester, New York, USA
    Pages729-732
    Publication statusPublished - 2002
    Publication typeA4 Article in a conference publication

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