The error concealment feature in the H.26L test model

Y-K. Wang, M. M. Hannuksela, V. Varsa, A. Hourunranta, M. Gabbouj

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

281 Citations (Scopus)

Translated title of the contribution	The error concealment feature in the H.26L test model
Original language	English
Title of host publication	Proceedings of IEEE 2002 Internantional Conference on Image Processing, ICIP, 22-25 September 2002, Rochester, New York, USA
Pages	729-732
Publication status	Published - 2002
Publication type	A4 Article in conference proceedings

Publication forum classification

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title = "The error concealment feature in the H.26L test model",

author = "Y-K. Wang and Hannuksela, {M. M.} and V. Varsa and A. Hourunranta and M. Gabbouj",

note = "0-7803-7622-6<br/>Contribution: organisation=sgn,FACT1=1",

year = "2002",

language = "English",

pages = "729--732",

booktitle = "Proceedings of IEEE 2002 Internantional Conference on Image Processing, ICIP, 22-25 September 2002, Rochester, New York, USA",

}

TY - GEN

T1 - The error concealment feature in the H.26L test model

AU - Wang, Y-K.

AU - Hannuksela, M. M.

AU - Varsa, V.

AU - Hourunranta, A.

AU - Gabbouj, M.

N1 - 0-7803-7622-6<br/>Contribution: organisation=sgn,FACT1=1

PY - 2002

Y1 - 2002

M3 - Conference contribution

SP - 729

EP - 732

BT - Proceedings of IEEE 2002 Internantional Conference on Image Processing, ICIP, 22-25 September 2002, Rochester, New York, USA

ER -