Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography

G. Bautista; C.M. Blanca; C. Saloma

doi:10.1364/AO.46.000855

Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography

G. Bautista, C.M. Blanca, C. Saloma

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)

Translated title of the contribution	Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography
Original language	English
Pages (from-to)	855-860
Number of pages	6
Journal	Applied Optics
Volume	46
Issue number	6
DOIs	https://doi.org/10.1364/AO.46.000855
Publication status	Published - 2007
Publication type	A1 Journal article-refereed

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Publication forum level 1

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10.1364/AO.46.000855

Cite this

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title = "Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography",

author = "G. Bautista and C.M. Blanca and C. Saloma",

note = "Contribution: organisation=fys,FACT1=1<br/>Publisher name: Optical Society of America",

year = "2007",

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language = "English",

volume = "46",

pages = "855--860",

journal = "Applied Optics",

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T1 - Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography

AU - Bautista, G.

AU - Blanca, C.M.

AU - Saloma, C.

N1 - Contribution: organisation=fys,FACT1=1<br/>Publisher name: Optical Society of America

PY - 2007

Y1 - 2007

U2 - 10.1364/AO.46.000855

DO - 10.1364/AO.46.000855

M3 - Article

SN - 1559-128X

VL - 46

SP - 855

EP - 860

JO - Applied Optics

JF - Applied Optics

IS - 6

ER -