Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers

J. Keränen, T. Lepistö, L. Ryen, S.V. Novikov, E. Olsson

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5 Citations (Scopus)

Translated title of the contribution	Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers
Original language	English
Pages (from-to)	6827-6831
Journal	Journal of Applied Physics
Volume	84
Issue number	12
Publication status	Published - 1998
Publication type	A1 Journal article-refereed

Publication forum classification

@article{bc7db3ea483f4a3a96b68cc7e21f861e,

title = "Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers",

author = "J. Ker{\"a}nen and T. Lepist{\"o} and L. Ryen and S.V. Novikov and E. Olsson",

note = "Contribution: organisation=mol elm,FACT1=1",

year = "1998",

language = "English",

volume = "84",

pages = "6827--6831",

journal = "Journal of Applied Physics",

issn = "0021-8979",

number = "12",

}

TY - JOUR

T1 - Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers

AU - Keränen, J.

AU - Lepistö, T.

AU - Ryen, L.

AU - Novikov, S.V.

AU - Olsson, E.

N1 - Contribution: organisation=mol elm,FACT1=1

PY - 1998

Y1 - 1998

M3 - Article

VL - 84

SP - 6827

EP - 6831

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 12

ER -