Web-wide diagnostics of paper properties based on fault detector system images

Jukka-Pekka Raunio, V. Tirronen, Risto Ritala, I. Nironen, R. Rossi, T. Kärkkäinen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Translated title of the contribution	Web-wide diagnostics of paper properties based on fault detector system images
Original language	English
Title of host publication	PaperCon 2010 Conference, Twenty-Third Process Industry Reliability and Maintenance Conference, May 2-5, 2010, Atlanta, GA, USA
Pages	1-13
Number of pages	13
Publication status	Published - 2010
Publication type	A4 Article in conference proceedings

Publication forum classification

@inproceedings{261ba84a1e6249bc80e5f84630360629,

title = "Web-wide diagnostics of paper properties based on fault detector system images",

author = "Jukka-Pekka Raunio and V. Tirronen and Risto Ritala and I. Nironen and R. Rossi and T. K{\"a}rkk{\"a}inen",

note = "Contribution: organisation=ase mit,FACT1=1",

year = "2010",

language = "English",

pages = "1--13",

booktitle = "PaperCon 2010 Conference, Twenty-Third Process Industry Reliability and Maintenance Conference, May 2-5, 2010, Atlanta, GA, USA",

}

Web-wide diagnostics of paper properties based on fault detector system images. / Raunio, Jukka-Pekka; Tirronen, V.; Ritala, Risto et al.
PaperCon 2010 Conference, Twenty-Third Process Industry Reliability and Maintenance Conference, May 2-5, 2010, Atlanta, GA, USA. 2010. p. 1-13.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Web-wide diagnostics of paper properties based on fault detector system images

AU - Raunio, Jukka-Pekka

AU - Tirronen, V.

AU - Ritala, Risto

AU - Nironen, I.

AU - Rossi, R.

AU - Kärkkäinen, T.

N1 - Contribution: organisation=ase mit,FACT1=1

PY - 2010

Y1 - 2010

M3 - Conference contribution

SP - 1

EP - 13

BT - PaperCon 2010 Conference, Twenty-Third Process Industry Reliability and Maintenance Conference, May 2-5, 2010, Atlanta, GA, USA

ER -