TY - GEN
T1 - Active Short-Long Exposure Deblurring
AU - Yang, Dan
AU - Koskinen, Samu
AU - Kämäräinen, Joni-Kristian
N1 - Publisher Copyright:
© 2022 IEEE.
jufoid=58099
PY - 2022
Y1 - 2022
N2 - Mobile phones can capture image bursts to produce high quality still photographs. The simplest form of a burst is two frame short-long (S-L) exposure. S-L exposure is particularly suitable in low light conditions where short exposure frames are sharp but noisy and dark, and long exposure frames are affected by motion blur but have better scene chromaticity and luminance. In this work, we take a step further and define active short-long exposure deblurring where the viewfinder frames before the burst are used to optimize the S-L exposure parameters. We introduce deep architectures and data generation for active S-L exposure deblurring. The approach is experimentally validated with realistic data and it shows clear improvements. For the most difficult scenes (worst 5%) the PSNR is improved by +1.39dB.
AB - Mobile phones can capture image bursts to produce high quality still photographs. The simplest form of a burst is two frame short-long (S-L) exposure. S-L exposure is particularly suitable in low light conditions where short exposure frames are sharp but noisy and dark, and long exposure frames are affected by motion blur but have better scene chromaticity and luminance. In this work, we take a step further and define active short-long exposure deblurring where the viewfinder frames before the burst are used to optimize the S-L exposure parameters. We introduce deep architectures and data generation for active S-L exposure deblurring. The approach is experimentally validated with realistic data and it shows clear improvements. For the most difficult scenes (worst 5%) the PSNR is improved by +1.39dB.
U2 - 10.1109/ICPR56361.2022.9956188
DO - 10.1109/ICPR56361.2022.9956188
M3 - Conference contribution
AN - SCOPUS:85143586876
T3 - Proceedings - International Conference on Pattern Recognition
SP - 281
EP - 287
BT - 2022 26th International Conference on Pattern Recognition, ICPR 2022
PB - IEEE
T2 - International Conference on Pattern Recognition
Y2 - 21 August 2022 through 25 August 2022
ER -