An Experimental Study of Scalability in Shield-Based On-Wafer CMOS Test Fixtures

Julkaisun otsikon käännös: An Experimental Study of Scalability in Shield-Based On-Wafer CMOS Test Fixtures

Tutkimustuotos: Artikkeli › Tieteellinen › vertaisarvioitu

4 Sitaatiot (Scopus)

Julkaisun otsikon käännös	An Experimental Study of Scalability in Shield-Based On-Wafer CMOS Test Fixtures
Alkuperäiskieli	Englanti
Sivut	945-953
Julkaisu	IEEE Transactions on Microwave Theory and Techniques
Vuosikerta	52
Numero	3
Tila	Julkaistu - 2004
OKM-julkaisutyyppi	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Julkaisufoorumi-taso

@article{2e0eefdfd3644762a0e928d9b458124d,

title = "An Experimental Study of Scalability in Shield-Based On-Wafer CMOS Test Fixtures",

author = "T. Kaija and E. Ristolainen",

note = "Contribution: organisation=ele,FACT1=1",

year = "2004",

language = "English",

volume = "52",

pages = "945--953",

journal = "IEEE Transactions on Microwave Theory and Techniques",

issn = "0018-9480",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

}

TY - JOUR

T1 - An Experimental Study of Scalability in Shield-Based On-Wafer CMOS Test Fixtures

AU - Kaija, T.

AU - Ristolainen, E.

N1 - Contribution: organisation=ele,FACT1=1

PY - 2004

Y1 - 2004

M3 - Article

SN - 0018-9480

VL - 52

SP - 945

EP - 953

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 3

ER -