Bayesian network model as an overall image quality measurement system

J. Pulla; M. Mettänen; K. Konkarikoski; R. Ritala

Bayesian network model as an overall image quality measurement system

Julkaisun otsikon käännös: Bayesian network model as an overall image quality measurement system

J. Pulla
, M. Mettänen
, K. Konkarikoski
, R. Ritala

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

3 Sitaatiot (Scopus)

Julkaisun otsikon käännös	Bayesian network model as an overall image quality measurement system
Alkuperäiskieli	Englanti
Otsikko	Proceedings of the 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France
Toimittajat	E. Benoit
Sivut	67-73
Tila	Julkaistu - 2008
OKM-julkaisutyyppi	B3 Vertaisarvioimaton artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

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http://www.listic.univ-savoie.fr

Siteeraa tätä

Pulla, J., Mettänen, M., Konkarikoski, K., & Ritala, R. (2008). Bayesian network model as an overall image quality measurement system. teoksessa E. Benoit (Toimittaja), Proceedings of the 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France (Sivut 67-73) http://www.listic.univ-savoie.fr

Pulla, J. ; Mettänen, M. ; Konkarikoski, K. et al. / Bayesian network model as an overall image quality measurement system. Proceedings of the 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France. Toimittaja / E. Benoit. 2008. Sivut 67-73

@inproceedings{dce606f256d348838d90b8e981fe62ac,

title = "Bayesian network model as an overall image quality measurement system",

author = "J. Pulla and M. Mett{\"a}nen and K. Konkarikoski and R. Ritala",

note = "Contribution: organisation=ase mit,FACT1=1",

year = "2008",

language = "English",

isbn = "2-9516453-8-4",

pages = "67--73",

editor = "E. Benoit",

booktitle = "Proceedings of the 12th IMEKO TC1 \& TC7 Joint Symposium on Man Science \& Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France",

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Pulla, J, Mettänen, M, Konkarikoski, K & Ritala, R 2008, Bayesian network model as an overall image quality measurement system. julkaisussa E Benoit (Toimittaja), Proceedings of the 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France. Sivut 67-73. <http://www.listic.univ-savoie.fr>

Bayesian network model as an overall image quality measurement system. / Pulla, J.; Mettänen, M.; Konkarikoski, K. et al.
Proceedings of the 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France. toim. / E. Benoit. 2008. s. 67-73.

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

TY - GEN

T1 - Bayesian network model as an overall image quality measurement system

AU - Pulla, J.

AU - Mettänen, M.

AU - Konkarikoski, K.

AU - Ritala, R.

N1 - Contribution: organisation=ase mit,FACT1=1

PY - 2008

Y1 - 2008

M3 - Conference contribution

SN - 2-9516453-8-4

SP - 67

EP - 73

BT - Proceedings of the 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France

A2 - Benoit, E.

ER -

Pulla J, Mettänen M, Konkarikoski K, Ritala R. Bayesian network model as an overall image quality measurement system. julkaisussa Benoit E, toimittaja, Proceedings of the 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, (TC1 - Education and Training in Measurement and Instrumentation; TC7 - Measurement Science), September 3-5, 2008, Aunecy, France. 2008. s. 67-73