Abstrakti
Cathodoluminescence mapping is used as a contactless method to probe the electron concentration gradient of Te-doped GaAs nanowires. The room temperature and low temperature (10 K) cathodoluminescence analysis method previously developed for GaAs:Si is first validated on five GaAs:Te thin film samples, before extending it to the two GaAs:Te NW samples. We evidence an electron concentration gradient ranging from below 1 × 1018cm-3to 3.3 ×1018cm-3along the axis of a GaAs:Te nanowire grown at 640 °C, and a homogeneous electron concentration of around 6-8 × 1017cm-3along the axis of a GaAs:Te nanowire grown at 620 °C. The differences in the electron concentration levels and gradients between the two nanowires is attributed to different Te incorporation efficiencies by vapor-solid and vapor-liquid-solid processes.
Alkuperäiskieli | Englanti |
---|---|
Sivumäärä | 13 |
Julkaisu | Nanotechnology |
Vuosikerta | 33 |
Numero | 18 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 10 helmik. 2022 |
OKM-julkaisutyyppi | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä |
Julkaisufoorumi-taso
- Jufo-taso 2
!!ASJC Scopus subject areas
- Bioengineering
- Yleinen kemia
- Yleinen materiaalitiede
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering