Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy

K. Rissa; T. Lepistö; M. Vähä-Nissi; A. Savolainen

Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy

Julkaisun otsikon käännös: Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy

K. Rissa
, T. Lepistö
, M. Vähä-Nissi
, A. Savolainen

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

Julkaisun otsikon käännös	Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy
Alkuperäiskieli	Englanti
Otsikko	Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999
Julkaisupaikka	Stockholm
Sivut	195-206
Tila	Julkaistu - 1999
OKM-julkaisutyyppi	B3 Vertaisarvioimaton artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

Ei tasoa

Siteeraa tätä

Rissa, K., Lepistö, T., Vähä-Nissi, M., & Savolainen, A. (1999). Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy. teoksessa Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999 (Sivut 195-206).

Rissa, K. ; Lepistö, T. ; Vähä-Nissi, M. et al. / Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy. Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999. Stockholm, 1999. Sivut 195-206

@inproceedings{eeb223bf8c8844a7ae9e3f3915f9a7f2,

title = "Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy",

author = "K. Rissa and T. Lepist{\"o} and M. V{\"a}h{\"a}-Nissi and A. Savolainen",

note = "1. laitos mol elm, 2. laitos pap<br/>Contribution: organisation=mol elm,FACT1=0.5<br/>Contribution: organisation=pap,FACT2=0.5",

year = "1999",

language = "English",

pages = "195--206",

booktitle = "Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999",

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Rissa, K , Lepistö, T, Vähä-Nissi, M & Savolainen, A 1999, Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy. julkaisussa Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999. Stockholm, Sivut 195-206.

Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy. / Rissa, K.; Lepistö, T.; Vähä-Nissi, M. et al.
Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999. Stockholm, 1999. s. 195-206.

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

TY - GEN

T1 - Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy

AU - Rissa, K.

AU - Lepistö, T.

AU - Vähä-Nissi, M.

AU - Savolainen, A.

N1 - 1. laitos mol elm, 2. laitos pap<br/>Contribution: organisation=mol elm,FACT1=0.5<br/>Contribution: organisation=pap,FACT2=0.5

PY - 1999

Y1 - 1999

M3 - Conference contribution

SP - 195

EP - 206

BT - Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999

CY - Stockholm

ER -

Rissa K , Lepistö T, Vähä-Nissi M, Savolainen A. Characterization of pigment and dispersion coatings using Atomic Force Microscopy and Scanning Electron Microscopy. julkaisussa Microscopy as a Tool in Pulp and Paper Research and Development, A state of the art symposium at STFI, An arrangement within the EC concerted action, FAIR-98-3681, Stockholm, June 21-22, 1999. Stockholm. 1999. s. 195-206