Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale

Julkaisun otsikon käännös: Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale

L. Nony, F. Bocquet, A.S. Foster, C. Loppacher

Tutkimustuotos: Luku › Tieteellinen › vertaisarvioitu

Julkaisun otsikon käännös	Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale
Alkuperäiskieli	Englanti
Otsikko	Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Julkaisupaikka	Berlin, Germany
Kustantaja	Springer
Sivut	69-97
Sivumäärä	29
ISBN (elektroninen)	978-3-642-22566-6
ISBN (painettu)	978-3-642-22565-9
DOI - pysyväislinkit	https://doi.org/10.1007/978-3-642-22566-6_5
Tila	Julkaistu - 2012
OKM-julkaisutyyppi	A3 Kirjan tai muun kokoomateoksen osa

Nimi	Springer Series in Surface Sciences
Kustantaja	Springer
Vuosikerta	48
ISSN (painettu)	0931-5195

Julkaisufoorumi-taso

@inbook{f50c192232614b33aee2cd84b026e2f6,

title = "Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale",

author = "L. Nony and F. Bocquet and A.S. Foster and C. Loppacher",

note = "Contribution: organisation=fys,FACT1=1<br/>Portfolio EDEND: 2013-12-29",

year = "2012",

doi = "10.1007/978-3-642-22566-6_5",

language = "English",

isbn = "978-3-642-22565-9",

series = "Springer Series in Surface Sciences",

publisher = "Springer",

pages = "69--97",

booktitle = "Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces",

}

Nony, L, Bocquet, F, Foster, AS & Loppacher, C 2012, Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale. julkaisussa Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces. Springer Series in Surface Sciences, Vuosikerta 48, Springer, Berlin, Germany, Sivut 69-97. https://doi.org/10.1007/978-3-642-22566-6_5

Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale. / Nony, L.; Bocquet, F.; Foster, A.S. et al.
Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces. Berlin, Germany: Springer, 2012. s. 69-97 (Springer Series in Surface Sciences; Vuosikerta 48).

Tutkimustuotos: Luku › Tieteellinen › vertaisarvioitu

TY - CHAP

T1 - Contribution of the numerical approach to kelvin probe force microscopy on the atomic-scale

AU - Nony, L.

AU - Bocquet, F.

AU - Foster, A.S.

AU - Loppacher, C.

N1 - Contribution: organisation=fys,FACT1=1<br/>Portfolio EDEND: 2013-12-29

PY - 2012

Y1 - 2012

U2 - 10.1007/978-3-642-22566-6_5

DO - 10.1007/978-3-642-22566-6_5

M3 - Chapter

SN - 978-3-642-22565-9

T3 - Springer Series in Surface Sciences

SP - 69

EP - 97

BT - Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces

PB - Springer

CY - Berlin, Germany

ER -