Siirry päänavigointiin Siirry hakuun Siirry pääsisältöön

Data-driven and Event-driven Integration Architecture for Plant-wide Industrial Process Monitoring and Control

    Tutkimustuotos: KonferenssiartikkeliTieteellinenvertaisarvioitu

    9 Sitaatiot (Scopus)

    Abstrakti

    Efficiency of industrial processes and a high quality of the products can be achieved with advanced monitoring and control solutions. In addition, industrial processes often consume large amounts of energy and through their efficiency and use of resources also have a significant environmental impact. For industrial process optimisation it is necessary to integrate distributed data and functionality into plant-wide coordinating level solutions. From an implementation point of view this is challenging due to different communication protocols and messaging structures. In this paper an integration architecture is proposed that decouples control systems using a message bus mediator approach. The mediator acts as a unified point of access that through adapters facilitates integration of existing control systems to advanced plant-wide data-driven and event-driven control. It is demonstrated with a laboratory case presenting two examples applicable to real-life industrial problems.
    AlkuperäiskieliEnglanti
    OtsikkoIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
    KustantajaIEEE
    Sivut2979-2985
    Sivumäärä7
    ISBN (elektroninen)978-1-5090-6684-1
    ISBN (painettu)978-1-5090-6685-8
    DOI - pysyväislinkit
    TilaJulkaistu - lokak. 2018
    OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
    TapahtumaAnnual Conference of the IEEE Industrial Electronics Society -
    Kesto: 1 tammik. 1900 → …

    Julkaisusarja

    Nimi
    ISSN (painettu)1553-572X

    Conference

    ConferenceAnnual Conference of the IEEE Industrial Electronics Society
    Ajanjakso1/01/00 → …

    Julkaisufoorumi-taso

    • Jufo-taso 1

    Sormenjälki

    Sukella tutkimusaiheisiin 'Data-driven and Event-driven Integration Architecture for Plant-wide Industrial Process Monitoring and Control'. Ne muodostavat yhdessä ainutlaatuisen sormenjäljen.

    Siteeraa tätä