Detailed Interference Analysis in Dense mmWave Systems Employing Dual-Polarized Antennas

Dmitrii Solomitckii, Vitaly Petrov, Hosein Nikopour, Mustafa Akdeniz, Oner Orhan, Nageen Himayat, Shilpa Talwar, Sergey Andreev, Yevgeni Koucheryavy

    Tutkimustuotos: KonferenssiartikkeliScientificvertaisarvioitu

    3 Sitaatiot (Scopus)
    8 Lataukset (Pure)


    The use of extremely high frequency (EHF) bands, known as millimeter-wave (mmWave) frequencies, requires densification of cells to maintain system performance at required levels. This may lead to potential increase of interference in practical mmWave networks, thus making it the limiting factor. On the other hand, attractive utilization of dual-polarized antennas may improve over this situation by mitigating some of the interfering components, which can be employed as part of interference control techniques. In this paper, an accurate two-stage ray-based characterization is conducted that models interference-related metrics while taking into account a detailed dual- polarized antenna model. In particular, we confirm that narrower pencil-beam antennas (HPBW = 13) have significant advantages as compared to antennas with relatively narrow beams (HPBW = 20 and HPBW = 50) in the environments with high levels of interference. Additionally, we demonstrate that in the Manhattan grid deployment a transition from interference- to noise-limited regime and back occurs at the cell inter-site distances of under 90 m and over 180 m, respectively.

    Otsikko2017 IEEE Globecom Workshops
    ISBN (elektroninen)9781538639207
    DOI - pysyväislinkit
    TilaJulkaistu - 24 tammik. 2018
    OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
    Tapahtuma IEEE Global Telecommunications Conference - Singapore, Singapore
    Kesto: 4 jouluk. 20178 jouluk. 2017


    Conference IEEE Global Telecommunications Conference


    • Jufo-taso 1

    !!ASJC Scopus subject areas

    • Computer Networks and Communications
    • Computer Science Applications
    • Hardware and Architecture
    • Safety, Risk, Reliability and Quality


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