Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

S. Cattaneo; M. Kauranen

doi:10.1364/OL.28.001445

Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

Julkaisun otsikon käännös: Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

S. Cattaneo
, M. Kauranen

Tutkimustuotos: Artikkeli › Tieteellinen › vertaisarvioitu

34 Sitaatiot (Scopus)

23 Lataukset (Pure)

Abstrakti

We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.

Julkaisun otsikon käännös	Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation
Alkuperäiskieli	Englanti
Sivut	1445-1447
Julkaisu	Optics Letters
Vuosikerta	28
Numero	16
DOI - pysyväislinkit	https://doi.org/10.1364/OL.28.001445
Tila	Julkaistu - 2003
OKM-julkaisutyyppi	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Julkaisufoorumi-taso

Jufo-taso 2

Pääsy asiakirjaan

10.1364/OL.28.001445

Cattaneo determination of second-order
This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-16-1445. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

http://urn.fi/URN:NBN:fi:tty-201103311120

Siteeraa tätä

@article{c44cacdce5ce4bd780c7b29280be9c2d,

title = "Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation",

abstract = "We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.",

author = "S. Cattaneo and M. Kauranen",

note = "Contribution: organisation=fys,FACT1=1",

year = "2003",

doi = "10.1364/OL.28.001445",

language = "English",

volume = "28",

pages = "1445--1447",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "Optica Publishing Group",

number = "16",

}

TY - JOUR

T1 - Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

AU - Cattaneo, S.

AU - Kauranen, M.

N1 - Contribution: organisation=fys,FACT1=1

PY - 2003

Y1 - 2003

N2 - We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.

AB - We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.

U2 - 10.1364/OL.28.001445

DO - 10.1364/OL.28.001445

M3 - Article

SN - 0146-9592

VL - 28

SP - 1445

EP - 1447

JO - Optics Letters

JF - Optics Letters

IS - 16

ER -

Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

Abstrakti

Julkaisufoorumi-taso

Pääsy asiakirjaan

Sormenjälki

Siteeraa tätä