Effect of protective casting materials on product level reliability under accelerated test conditions

J. Pippola; T. Marttila; L. Frisk

Effect of protective casting materials on product level reliability under accelerated test conditions

Julkaisun otsikon käännös: Effect of protective casting materials on product level reliability under accelerated test conditions

J. Pippola, T. Marttila, L. Frisk

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

3 Sitaatiot (Scopus)

Julkaisun otsikon käännös	Effect of protective casting materials on product level reliability under accelerated test conditions
Alkuperäiskieli	Englanti
Otsikko	EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France
Kustantaja	IEEE
Sivut	1-6
Sivumäärä	6
ISBN (painettu)	978-2-95-274671-7
Tila	Julkaistu - 2013
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisusarja

Nimi	European Microelectronics and Packaging Conference

Julkaisufoorumi-taso

Jufo-taso 1

Pääsy asiakirjaan

http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6698651

Siteeraa tätä

Pippola, J., Marttila, T., & Frisk, L. (2013). Effect of protective casting materials on product level reliability under accelerated test conditions. teoksessa EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France (Sivut 1-6). (European Microelectronics and Packaging Conference). IEEE. http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6698651

@inproceedings{e3f84097907b4b4aa60c74d7f663ff59,

title = "Effect of protective casting materials on product level reliability under accelerated test conditions",

author = "J. Pippola and T. Marttila and L. Frisk",

note = "Contribution: organisation=dee,FACT1=1<br/>Portfolio EDEND: 2013-12-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE",

year = "2013",

language = "English",

isbn = "978-2-95-274671-7",

series = "European Microelectronics and Packaging Conference",

publisher = "IEEE",

pages = "1--6",

booktitle = "EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France",

address = "United States",

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Pippola, J, Marttila, T & Frisk, L 2013, Effect of protective casting materials on product level reliability under accelerated test conditions. julkaisussa EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France. European Microelectronics and Packaging Conference, IEEE, Sivut 1-6. <http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6698651>

Effect of protective casting materials on product level reliability under accelerated test conditions. / Pippola, J.; Marttila, T.; Frisk, L.
EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France. IEEE, 2013. s. 1-6 (European Microelectronics and Packaging Conference).

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

TY - GEN

T1 - Effect of protective casting materials on product level reliability under accelerated test conditions

AU - Pippola, J.

AU - Marttila, T.

AU - Frisk, L.

N1 - Contribution: organisation=dee,FACT1=1<br/>Portfolio EDEND: 2013-12-29<br/>Publisher name: Institute of Electrical and Electronics Engineers IEEE

PY - 2013

Y1 - 2013

M3 - Conference contribution

SN - 978-2-95-274671-7

T3 - European Microelectronics and Packaging Conference

SP - 1

EP - 6

BT - EMPC 2013, European Microelectronics Packaking Conference, 9-12 September 2013, Grenoble, France

PB - IEEE

ER -