Effects of different temperature cycling test profiles on the reliability of UHF RFID tags

Julkaisun otsikon käännös: Effects of different temperature cycling test profiles on the reliability of UHF RFID tags

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

5 Sitaatiot (Scopus)

Julkaisun otsikon käännös	Effects of different temperature cycling test profiles on the reliability of UHF RFID tags
Alkuperäiskieli	Englanti
Otsikko	ESTC 2012. 4th Electronics System Integration Technologies Conference, September 17-20, 2012, Amsterdam, Netherlands
Sivut	1-4
Sivumäärä	4
DOI - pysyväislinkit	https://doi.org/10.1109/ESTC.2012.6542202
Tila	Julkaistu - 2012
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

@inproceedings{2184ef4cd3f841d18c5dae0d2529c694,

title = "Effects of different temperature cycling test profiles on the reliability of UHF RFID tags",

author = "Kirsi Saarinen and Laura Frisk",

note = "Contribution: organisation=ele,FACT1=1",

year = "2012",

doi = "10.1109/ESTC.2012.6542202",

language = "English",

isbn = "978-1-4673-4645-0",

pages = "1--4",

booktitle = "ESTC 2012. 4th Electronics System Integration Technologies Conference, September 17-20, 2012, Amsterdam, Netherlands",

}

TY - GEN

T1 - Effects of different temperature cycling test profiles on the reliability of UHF RFID tags

AU - Saarinen, Kirsi

AU - Frisk, Laura

N1 - Contribution: organisation=ele,FACT1=1

PY - 2012

Y1 - 2012

U2 - 10.1109/ESTC.2012.6542202

DO - 10.1109/ESTC.2012.6542202

M3 - Conference contribution

SN - 978-1-4673-4645-0

SP - 1

EP - 4

BT - ESTC 2012. 4th Electronics System Integration Technologies Conference, September 17-20, 2012, Amsterdam, Netherlands

ER -