Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies

Julkaisun otsikon käännös: Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

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Julkaisun otsikon käännös	Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies
Alkuperäiskieli	Englanti
Otsikko	The IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2008), 8 to 11 December, Singapore
Sivut	12-16
DOI - pysyväislinkit	https://doi.org/10.1109/IEEM.2008.4737823
Tila	Julkaistu - 2008
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

@inproceedings{880bbd0bb7164f49b20dd09e4253859c,

title = "Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies",

author = "H. J{\"a}rvenp{\"a}{\"a} and S.J. M{\"a}kinen",

note = "CD-ROM<br/>Contribution: organisation=tta,FACT1=1",

year = "2008",

doi = "10.1109/IEEM.2008.4737823",

language = "English",

isbn = "978-1-4244-2630-0",

pages = "12--16",

booktitle = "The IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2008), 8 to 11 December, Singapore",

}

TY - GEN

T1 - Empirically detecting the hype cycle with the life cycle indicators: an exploratory analysis of three technologies

AU - Järvenpää, H.

AU - Mäkinen, S.J.

N1 - CD-ROM<br/>Contribution: organisation=tta,FACT1=1

PY - 2008

Y1 - 2008

U2 - 10.1109/IEEM.2008.4737823

DO - 10.1109/IEEM.2008.4737823

M3 - Conference contribution

SN - 978-1-4244-2630-0

SP - 12

EP - 16

BT - The IEEE International Conference on Industrial Engineering and Engineering Management (IEEM 2008), 8 to 11 December, Singapore

ER -