Ensuring the Robustness and Reliability of Data-Driven Knowledge Discovery Models in Production and Manufacturing

  • Shailesh Tripathi*
  • , David Muhr
  • , Manuel Brunner
  • , Herbert Jodlbauer
  • , Matthias Dehmer
  • , Frank Emmert-Streib
  • *Tämän työn vastaava kirjoittaja

Tutkimustuotos: Katsausartikkelivertaisarvioitu

47 Sitaatiot (Scopus)
18 Lataukset (Pure)

Abstrakti

The Cross-Industry Standard Process for Data Mining (CRISP-DM) is a widely accepted framework in production and manufacturing. This data-driven knowledge discovery framework provides an orderly partition of the often complex data mining processes to ensure a practical implementation of data analytics and machine learning models. However, the practical application of robust industry-specific data-driven knowledge discovery models faces multiple data- and model development-related issues. These issues need to be carefully addressed by allowing a flexible, customized and industry-specific knowledge discovery framework. For this reason, extensions of CRISP-DM are needed. In this paper, we provide a detailed review of CRISP-DM and summarize extensions of this model into a novel framework we call Generalized Cross-Industry Standard Process for Data Science (GCRISP-DS). This framework is designed to allow dynamic interactions between different phases to adequately address data- and model-related issues for achieving robustness. Furthermore, it emphasizes also the need for a detailed business understanding and the interdependencies with the developed models and data quality for fulfilling higher business objectives. Overall, such a customizable GCRISP-DS framework provides an enhancement for model improvements and reusability by minimizing robustness-issues.

AlkuperäiskieliEnglanti
Artikkeli576892
JulkaisuFrontiers in artificial intelligence
Vuosikerta4
DOI - pysyväislinkit
TilaJulkaistu - 14 kesäk. 2021
OKM-julkaisutyyppiA2 Katsausartikkeli tieteellisessä aikakauslehdessä

Julkaisufoorumi-taso

  • Jufo-taso 1

!!ASJC Scopus subject areas

  • Artificial Intelligence

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