Evaluation of lateral composition modulation in Ga(As,Bi) epilayers by X-Ray diffraction

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

Alkuperäiskieli	Englanti
Otsikko	18th European Molecular Beam Epitaxy Workshop
Julkaisupaikka	Canazei, Italy
Tila	Julkaistu - 15 maalisk. 2015
OKM-julkaisutyyppi	B3 Vertaisarvioimaton artikkeli konferenssijulkaisussa

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@inproceedings{e259fd1a29394e2190274c91c07d0346,

title = "Evaluation of lateral composition modulation in Ga(As,Bi) epilayers by X-Ray diffraction",

author = "Mingjian Wu and Michael Hanke and Esperanza Luna and Puustinen, \{Janne Paavo Petteri\} and Guina, \{Mircea Dorel\} and Achim Trampert",

note = "xposter",

year = "2015",

month = mar,

day = "15",

language = "English",

booktitle = "18th European Molecular Beam Epitaxy Workshop",

}

TY - GEN

T1 - Evaluation of lateral composition modulation in Ga(As,Bi) epilayers by X-Ray diffraction

AU - Wu, Mingjian

AU - Hanke, Michael

AU - Luna, Esperanza

AU - Puustinen, Janne Paavo Petteri

AU - Guina, Mircea Dorel

AU - Trampert, Achim

N1 - xposter

PY - 2015/3/15

Y1 - 2015/3/15

UR - http://web.nano.cnr.it/eurombe2015/wp-content/uploads/2014/03/Excerpt-program-01032015.pdf

M3 - Conference contribution

BT - 18th European Molecular Beam Epitaxy Workshop

CY - Canazei, Italy

ER -