Fault detection in stack filter circuits based on sample selection probabilities

Julkaisun otsikon käännös: Fault detection in stack filter circuits based on sample selection probabilities

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

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Julkaisun otsikon käännös	Fault detection in stack filter circuits based on sample selection probabilities
Alkuperäiskieli	Englanti
Otsikko	Proc. of ICIP'96 International Conference on Image Processing, September 1996, Lausanne, Switzerland
Kustantaja	IEEE
Sivut	765-768
Tila	Julkaistu - 1996
OKM-julkaisutyyppi	B3 Vertaisarvioimaton artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

@inproceedings{31adb6265f7647d3a2789b0e8fb5395c,

title = "Fault detection in stack filter circuits based on sample selection probabilities",

author = "I. Dhaou and D. Akopian and P. Kuosmanen and J. Astola",

note = "Contribution: organisation=sgn,FACT1=1",

year = "1996",

language = "English",

pages = "765--768",

booktitle = "Proc. of ICIP'96 International Conference on Image Processing, September 1996, Lausanne, Switzerland",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Fault detection in stack filter circuits based on sample selection probabilities

AU - Dhaou, I.

AU - Akopian, D.

AU - Kuosmanen, P.

AU - Astola, J.

N1 - Contribution: organisation=sgn,FACT1=1

PY - 1996

Y1 - 1996

M3 - Conference contribution

SP - 765

EP - 768

BT - Proc. of ICIP'96 International Conference on Image Processing, September 1996, Lausanne, Switzerland

PB - IEEE

ER -