High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors

Lasse Orsila; Janne Hyyti; Antti Härkönen; Günter Steinmeyer; Mircea Guina

High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors

Julkaisun otsikon käännös: High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors

Lasse Orsila, Janne Hyyti, Antti Härkönen, Günter Steinmeyer, Mircea Guina

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

Julkaisun otsikon käännös	High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors
Alkuperäiskieli	Englanti
Otsikko	Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland
Kustantaja	Finnish Optical Society
Sivut	51-51
Sivumäärä	1
ISBN (painettu)	978-952-12-3055-4
Tila	Julkaistu - 2014
OKM-julkaisutyyppi	B3 Vertaisarvioimaton artikkeli konferenssijulkaisussa
Tapahtuma	Optics and Photonics Days - Kesto: 1 tammik. 2014 → …

Julkaisusarja

Nimi	Optics and Photonics Days

Conference

Conference	Optics and Photonics Days
Ajanjakso	1/01/14 → …

Siteeraa tätä

Orsila, L., Hyyti, J., Härkönen, A., Steinmeyer, G., & Guina, M. (2014). High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors. teoksessa Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland (Sivut 51-51). (Optics and Photonics Days). Finnish Optical Society.

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title = "High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors",

author = "Lasse Orsila and Janne Hyyti and Antti H{\"a}rk{\"o}nen and G{\"u}nter Steinmeyer and Mircea Guina",

note = "Contribution: organisation=orc,FACT1=1<br/>Portfolio EDEND: 2014-10-24<br/>Publisher name: Finnish Optical Society; Optics and Photonics Days ; Conference date: 01-01-2014",

year = "2014",

language = "English",

isbn = "978-952-12-3055-4",

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Orsila, L, Hyyti, J, Härkönen, A, Steinmeyer, G & Guina, M 2014, High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors. julkaisussa Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland. Optics and Photonics Days, Finnish Optical Society, Sivut 51-51, Optics and Photonics Days, 1/01/14.

High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors. / Orsila, Lasse; Hyyti, Janne; Härkönen, Antti et al.
Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland. Finnish Optical Society, 2014. s. 51-51 (Optics and Photonics Days).

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

TY - GEN

T1 - High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors

AU - Orsila, Lasse

AU - Hyyti, Janne

AU - Härkönen, Antti

AU - Steinmeyer, Günter

AU - Guina, Mircea

N1 - Contribution: organisation=orc,FACT1=1<br/>Portfolio EDEND: 2014-10-24<br/>Publisher name: Finnish Optical Society

PY - 2014

Y1 - 2014

M3 - Conference contribution

SN - 978-952-12-3055-4

T3 - Optics and Photonics Days

SP - 51

EP - 51

BT - Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland

PB - Finnish Optical Society

T2 - Optics and Photonics Days

Y2 - 1 January 2014

ER -

Orsila L, Hyyti J, Härkönen A, Steinmeyer G, Guina M. High-accuracy method for sample positioning in tightly focused nonlinear reflectivity measurement systems for semiconductor saturable absorber mirrors. julkaisussa Optics and Photonics Days 2014, OPD2014 Proceedings, 20-22 May, 2014, Turku, Finland. Finnish Optical Society. 2014. s. 51-51. (Optics and Photonics Days).