IR-based system for short-circuit detection during copper electrorefining process

Julkaisun otsikon käännös: IR-based system for short-circuit detection during copper electrorefining process

E. Mäkipää, J.T. Tanttu, H. Virtanen

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen

10 Sitaatiot (Scopus)

Julkaisun otsikon käännös	IR-based system for short-circuit detection during copper electrorefining process
Alkuperäiskieli	Englanti
Otsikko	Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE
Toimittajat	K.W. Tobin, N.S. Chang
Sivut	2-9
Tila	Julkaistu - 1999
OKM-julkaisutyyppi	B3 Vertaisarvioimaton artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

@inproceedings{200d3d1731bb4a8ca35edbbc7d393c0b,

title = "IR-based system for short-circuit detection during copper electrorefining process",

author = "E. M{\"a}kip{\"a}{\"a} and J.T. Tanttu and H. Virtanen",

note = "Contribution: organisation=pori ttp,FACT1=1",

year = "1999",

language = "English",

pages = "2--9",

editor = "K.W. Tobin and N.S. Chang",

booktitle = "Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE",

}

TY - GEN

T1 - IR-based system for short-circuit detection during copper electrorefining process

AU - Mäkipää, E.

AU - Tanttu, J.T.

AU - Virtanen, H.

N1 - Contribution: organisation=pori ttp,FACT1=1

PY - 1999

Y1 - 1999

M3 - Conference contribution

SP - 2

EP - 9

BT - Machine Vision Applications in Industrial Inpection VII, 25-26 January 1999, San Jose, CA. Proceedings of SPIE

A2 - Tobin, K.W.

A2 - Chang, N.S.

ER -