Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal

T. Roinila; H. Zeng; J. Verho; X. Yu; M. Vilkko; P. Kallio; J. Lekkala; T. Li; Y. Wang

Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal

Julkaisun otsikon käännös: Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal

T. Roinila, H. Zeng, J. Verho, X. Yu, M. Vilkko, P. Kallio, J. Lekkala, T. Li, Y. Wang

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

Julkaisun otsikon käännös	Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal
Alkuperäiskieli	Englanti
Otsikko	Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC
Kustantaja	Nano Science and Technology Institute
Sivut	23-26
Sivumäärä	4
ISBN (painettu)	978-1-4822-0581-7
Tila	Julkaistu - 2013
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisusarja

Nimi	Nanotechnology Conference and Expo
Kustantaja	Nano Science and Technology Institute
Vuosikerta	1

Julkaisufoorumi-taso

Ei tasoa

Siteeraa tätä

Roinila, T., Zeng, H., Verho, J., Yu, X., Vilkko, M., Kallio, P., Lekkala, J., Li, T., & Wang, Y. (2013). Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal. teoksessa Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC (Sivut 23-26). (Nanotechnology Conference and Expo; Vuosikerta 1). Nano Science and Technology Institute.

Roinila, T. ; Zeng, H. ; Verho, J. et al. / Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal. Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC. Nano Science and Technology Institute, 2013. Sivut 23-26 (Nanotechnology Conference and Expo).

@inproceedings{ae408775f6bb41fba05147a263cb96c3,

title = "Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal",

author = "T. Roinila and H. Zeng and J. Verho and X. Yu and M. Vilkko and P. Kallio and J. Lekkala and T. Li and Y. Wang",

note = "Contribution: organisation=ase,FACT1=1<br/>Portfolio EDEND: 2013-10-29",

year = "2013",

language = "English",

isbn = "978-1-4822-0581-7",

series = "Nanotechnology Conference and Expo",

publisher = "Nano Science and Technology Institute",

pages = "23--26",

booktitle = "Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference \& Expo 2013, May 12-16, 2013 Washington, DC",

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Roinila, T, Zeng, H, Verho, J, Yu, X, Vilkko, M , Kallio, P, Lekkala, J, Li, T & Wang, Y 2013, Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal. julkaisussa Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC. Nanotechnology Conference and Expo, Vuosikerta 1, Nano Science and Technology Institute, Sivut 23-26.

Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal. / Roinila, T.; Zeng, H.; Verho, J. et al.
Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC. Nano Science and Technology Institute, 2013. s. 23-26 (Nanotechnology Conference and Expo; Vuosikerta 1).

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

TY - GEN

T1 - Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal

AU - Roinila, T.

AU - Zeng, H.

AU - Verho, J.

AU - Yu, X.

AU - Vilkko, M.

AU - Kallio, P.

AU - Lekkala, J.

AU - Li, T.

AU - Wang, Y.

N1 - Contribution: organisation=ase,FACT1=1<br/>Portfolio EDEND: 2013-10-29

PY - 2013

Y1 - 2013

M3 - Conference contribution

SN - 978-1-4822-0581-7

T3 - Nanotechnology Conference and Expo

SP - 23

EP - 26

BT - Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC

PB - Nano Science and Technology Institute

ER -

Roinila T, Zeng H, Verho J, Yu X, Vilkko M , Kallio P et al. Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal. julkaisussa Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites Nanotech, Conference & Expo 2013, May 12-16, 2013 Washington, DC. Nano Science and Technology Institute. 2013. s. 23-26. (Nanotechnology Conference and Expo).