Microscopic second-order susceptibility tensor analysis

Mikko J. Huttunen; Liisa Naskali; Matti Virkki; Godofredo Bautista; Andreas Der; Martti Kauranen

Microscopic second-order susceptibility tensor analysis

Julkaisun otsikon käännös: Microscopic second-order susceptibility tensor analysis

Mikko J. Huttunen, Liisa Naskali, Matti Virkki, Godofredo Bautista, Andreas Der, Martti Kauranen

Tutkimustuotos: Konferenssiartikkeli › Scientific › vertaisarvioitu

Julkaisun otsikon käännös	Microscopic second-order susceptibility tensor analysis
Alkuperäiskieli	Englanti
Otsikko	2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany
Kustantaja	IEEE
Sivut	1-1
Sivumäärä	1
ISBN (painettu)	978-1-4799-0594-2
Tila	Julkaistu - 2013
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisusarja

Nimi	European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference

Julkaisufoorumi-taso

Ei tasoa

Siteeraa tätä

Huttunen, M. J., Naskali, L., Virkki, M., Bautista, G., Der, A., & Kauranen, M. (2013). Microscopic second-order susceptibility tensor analysis. teoksessa 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany (Sivut 1-1). (European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference). IEEE.

Huttunen, Mikko J. ; Naskali, Liisa ; Virkki, Matti et al. / Microscopic second-order susceptibility tensor analysis. 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany. IEEE, 2013. Sivut 1-1 (European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference).

@inproceedings{3bb64bb431e846aeb169666116ed3c31,

title = "Microscopic second-order susceptibility tensor analysis",

author = "Huttunen, {Mikko J.} and Liisa Naskali and Matti Virkki and Godofredo Bautista and Andreas Der and Martti Kauranen",

note = "Contribution: organisation=fys,FACT1=1<br/>Portfolio EDEND: 2013-07-29<br/>Publisher name: IEEE",

year = "2013",

language = "English",

isbn = "978-1-4799-0594-2",

series = "European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference",

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booktitle = "2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany",

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Huttunen, MJ, Naskali, L, Virkki, M, Bautista, G, Der, A & Kauranen, M 2013, Microscopic second-order susceptibility tensor analysis. julkaisussa 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany. European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, IEEE, Sivut 1-1.

Microscopic second-order susceptibility tensor analysis. / Huttunen, Mikko J.; Naskali, Liisa; Virkki, Matti et al.

2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany. IEEE, 2013. s. 1-1 (European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference).

Tutkimustuotos: Konferenssiartikkeli › Scientific › vertaisarvioitu

TY - GEN

T1 - Microscopic second-order susceptibility tensor analysis

AU - Huttunen, Mikko J.

AU - Naskali, Liisa

AU - Virkki, Matti

AU - Bautista, Godofredo

AU - Der, Andreas

AU - Kauranen, Martti

N1 - Contribution: organisation=fys,FACT1=1<br/>Portfolio EDEND: 2013-07-29<br/>Publisher name: IEEE

PY - 2013

Y1 - 2013

M3 - Conference contribution

SN - 978-1-4799-0594-2

T3 - European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference

SP - 1

EP - 1

BT - 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany

PB - IEEE

ER -

Huttunen MJ, Naskali L, Virkki M, Bautista G, Der A, Kauranen M. Microscopic second-order susceptibility tensor analysis. julkaisussa 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/EUROPE - IQEC 2013, 12-16 May 2013, Munich, Germany. IEEE. 2013. s. 1-1. (European Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference).