Novel Image Quality Metric Based on Similarity

Lina Jin; Nikolay Ponomarenko; Karen Egiazarian

doi:10.1109/ISSCS.2011.5978673

Novel Image Quality Metric Based on Similarity

Julkaisun otsikon käännös: Novel Image Quality Metric Based on Similarity

Lina Jin
, Nikolay Ponomarenko
, Karen Egiazarian

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

5 Sitaatiot (Scopus)

Julkaisun otsikon käännös	Novel Image Quality Metric Based on Similarity
Alkuperäiskieli	Englanti
Otsikko	International Symposium on Signals, Circuits and Systems, ISSCS 2011, June 30 - July 1, Iasi, Romania
Julkaisupaikka	Piscataway, NJ
Kustantaja	IEEE
Sivut	117-120
ISBN (painettu)	978-1-61284-942-3
DOI - pysyväislinkit	https://doi.org/10.1109/ISSCS.2011.5978673
Tila	Julkaistu - 2011
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisusarja

Nimi	International Symposium on Signals, Circuits and Systems ISSCS
Kustantaja	IEEE

Julkaisufoorumi-taso

Jufo-taso 1

Pääsy asiakirjaan

10.1109/ISSCS.2011.5978673

Siteeraa tätä

@inproceedings{5f8b3cc863764ee9a4a13ce49fe32f5f,

title = "Novel Image Quality Metric Based on Similarity",

author = "Lina Jin and Nikolay Ponomarenko and Karen Egiazarian",

note = "IEEE Catalog Number CFP11816-CDR. ei ut-numeroa 15.3.2014<br/>Contribution: organisation=sgn,FACT1=1",

year = "2011",

doi = "10.1109/ISSCS.2011.5978673",

language = "English",

isbn = "978-1-61284-942-3",

series = "International Symposium on Signals, Circuits and Systems ISSCS",

publisher = "IEEE",

pages = "117--120",

booktitle = "International Symposium on Signals, Circuits and Systems, ISSCS 2011, June 30 - July 1, Iasi, Romania",

address = "United States",

}

Novel Image Quality Metric Based on Similarity. / Jin, Lina; Ponomarenko, Nikolay; Egiazarian, Karen.
International Symposium on Signals, Circuits and Systems, ISSCS 2011, June 30 - July 1, Iasi, Romania. Piscataway, NJ: IEEE, 2011. s. 117-120 (International Symposium on Signals, Circuits and Systems ISSCS).

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

TY - GEN

T1 - Novel Image Quality Metric Based on Similarity

AU - Jin, Lina

AU - Ponomarenko, Nikolay

AU - Egiazarian, Karen

N1 - IEEE Catalog Number CFP11816-CDR. ei ut-numeroa 15.3.2014<br/>Contribution: organisation=sgn,FACT1=1

PY - 2011

Y1 - 2011

U2 - 10.1109/ISSCS.2011.5978673

DO - 10.1109/ISSCS.2011.5978673

M3 - Conference contribution

SN - 978-1-61284-942-3

T3 - International Symposium on Signals, Circuits and Systems ISSCS

SP - 117

EP - 120

BT - International Symposium on Signals, Circuits and Systems, ISSCS 2011, June 30 - July 1, Iasi, Romania

PB - IEEE

CY - Piscataway, NJ

ER -