Abstrakti
In this paper, the structural, thermal, optical, and spectroscopic properties of Er3+-doped tellurite glasses with the composition 68.25TeO2–19.5ZnO–9.75X–2.5Er2O3 (in mol%) with X = BaO, Na2O, and Bi2O3 are reported. The glasses were prepared using the standard melt quenching method. The investigated glasses exhibit low phonon energy (∼745 cm−1) and low glass transition temperature varying between 300 and 350°C depending on the glass composition. The Raman spectra show a regular tellurite structure with variations in the number of bridging and non-bridging oxygens depending on the glass composition, the Na2O and Bi2O3-containing glasses having the most and the least polymerized network, respectively. A thermal treatment of the glasses leads to the formation of crystals, the composition of which depends on the glass composition, as revealed by X-ray diffraction analysis and confirmed using scanning electron microscope-energy-dispersive spectroscopy. The precipitation of Er-containing crystals in the Na2O and BaO-containing glasses leads to an increase in the intensity of the upconversion emissions. Although the Er3+ ions remain in the amorphous part of the Bi2O3-containing glass after heat treatment, it is the precipitation of Bi3.2Te0.8O6.4 crystals in this glass, which is thought to decrease the distance between the Er3+ ions leading to an increase in the intensity of the upconversion and mid-infrared emissions.
Alkuperäiskieli | Englanti |
---|---|
Sivut | 7186-7195 |
Sivumäärä | 10 |
Julkaisu | JOURNAL OF THE AMERICAN CERAMIC SOCIETY |
Vuosikerta | 105 |
Numero | 12 |
DOI - pysyväislinkit | |
Tila | Julkaistu - jouluk. 2022 |
OKM-julkaisutyyppi | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä |
Julkaisufoorumi-taso
- Jufo-taso 2
!!ASJC Scopus subject areas
- Ceramics and Composites
- Materials Chemistry
Sormenjälki
Sukella tutkimusaiheisiin 'Study of visible, NIR, and MIR spectroscopic properties of Er3+-doped tellurite glasses and glass–ceramics'. Ne muodostavat yhdessä ainutlaatuisen sormenjäljen.Laitteet
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Tampereen Mikroskopiakeskus
Vippola, M. (Manager), Honkanen, M. (Operator) & Salminen, T. (Operator)
Tekniikan ja luonnontieteiden tiedekuntaLaitteistot/tilat: Facility