System level reliability testing for high reliability devices

Julkaisun otsikon käännös: System level reliability testing for high reliability devices

Tutkimustuotos: Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

3 Sitaatiot (Scopus)

Julkaisun otsikon käännös	System level reliability testing for high reliability devices
Alkuperäiskieli	Englanti
Otsikko	9th Electronics Packaging Technology Conference (EPTC 2007), December 10-12, 2007, Grand Copthorne Waterfront, Singapore
Sivut	897-901
DOI - pysyväislinkit	https://doi.org/10.1109/EPTC.2007.4469754
Tila	Julkaistu - 2007
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Julkaisufoorumi-taso

@inproceedings{39a7f48840d749dfbd3f3007717d8ba1,

title = "System level reliability testing for high reliability devices",

author = "S. Kuusiluoma and J. Kiilunen and J. Virkki",

note = "Contribution: organisation=ele,FACT1=1",

year = "2007",

doi = "10.1109/EPTC.2007.4469754",

language = "English",

isbn = "978-1-4244-1323-2",

pages = "897--901",

booktitle = "9th Electronics Packaging Technology Conference (EPTC 2007), December 10-12, 2007, Grand Copthorne Waterfront, Singapore",

}

TY - GEN

T1 - System level reliability testing for high reliability devices

AU - Kuusiluoma, S.

AU - Kiilunen, J.

AU - Virkki, J.

N1 - Contribution: organisation=ele,FACT1=1

PY - 2007

Y1 - 2007

U2 - 10.1109/EPTC.2007.4469754

DO - 10.1109/EPTC.2007.4469754

M3 - Conference contribution

SN - 978-1-4244-1323-2

SP - 897

EP - 901

BT - 9th Electronics Packaging Technology Conference (EPTC 2007), December 10-12, 2007, Grand Copthorne Waterfront, Singapore

ER -