Temperature dependence of a depth-encoded system for polarization-sensitive optical coherence tomography using a PM fiber

Philipp Tatar-Mathes, Rasmus Eilkær Hansen, Samuel Choi, Manuel J. Marques, Niels Møller Israelsen, Adrian Podoleanu

Tutkimustuotos: KonferenssiartikkeliTieteellinenvertaisarvioitu

7 Lataukset (Pure)

Abstrakti

With the aim of applying complex master/slave interferometry (CMSI) to polarizationsensitive optical coherence tomography (PS-OCT) for birefringent tomographic measurements of biological tissue, we present the impact of temperature instability on an all-fiber-based depth-encoded PS-OCT system and the practicality of temperature control for birefringence measurements. In our PS-OCT system, two orthogonally polarized interrogating beams were separated to a depth of approximately 1 mm using a 5-meter long polarization-maintaining fiber (PMF) as a passive delay unit, which is susceptible to temperature instability. The variation in resolution and delay due to temperature change of PMF were investigated. Furthermore, it is shown that tomographic birefringence can be measured under temperature-controlled operation utilizing the advantages of CMSI. We found that changes to the location of generated masks caused by an emerging temperature drift between the channels can be corrected with our presented characterization.

AlkuperäiskieliEnglanti
OtsikkoAdvances in 3OM
AlaotsikkoOpto-Mechatronics, Opto-Mechanics, and Optical Metrology, 3OM 2023
ToimittajatVirgil-Florin Duma, Virgil-Florin Duma, Jannick P. Rolland, Adrian G. H. Podoleanu, Mircea Guina, Cosmin Sinescu
KustantajaSPIE
ISBN (elektroninen)9781510680715
DOI - pysyväislinkit
TilaJulkaistu - 2024
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
TapahtumaAdvances in 3OM: Opto-Mechatronics, Opto-Mechanics, and Optical Metrology - Timisoara, Romania
Kesto: 11 jouluk. 202314 jouluk. 2023

Julkaisusarja

NimiProceedings of SPIE - The International Society for Optical Engineering
Vuosikerta13187
ISSN (painettu)0277-786X
ISSN (elektroninen)1996-756X

Conference

ConferenceAdvances in 3OM: Opto-Mechatronics, Opto-Mechanics, and Optical Metrology
Lyhennettä3OM
Maa/AlueRomania
KaupunkiTimisoara
Ajanjakso11/12/2314/12/23

Julkaisufoorumi-taso

  • Jufo-taso 0

!!ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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